Design of a High Performance Low Cost IC Tester-A Conceptual View

Abstract

With the improvement of integration technology, complexity of Integrated Circuit (IC) is increasing day by day. The test of such circuit has
become a challenge, since it ensures the reliability of electronic products and impacts upon the quality. Conventional IC tester, ATE
(Automatic Test Equipment) suffers from serious drawbacks and point towards having a new approach for its economic solution with
reliable performance in respect to storage requirement, test application time and fault coverage. In this paper the conceptual design of a high
performance low cost IC tester have been proposed. Different test technologies and pattern generator have been reviewed and shown that
mixed-mode approach with GLFSR as a pattern generator outperforms all other existing test technologies. In designing of the proposed IC
tester GLFSR based mixed-mode approach has been incorporated. It is expected that GLFSR based mixed-mode technique will alleviate the
problem of ATE and enhance the performance of the IC tester.